Process metrology systems for micro-component process measurements at Process Metrology.

Viewmm01 Sep, 2022Technology

Process Metrology is the scientific study of measurement that is used in designing and controlling manufacturing processes. A product sample is processed, the property is measured, and the process is adjusted to bring the next processed sample closer to its specification. VIEW offers a full line of process metrology systems for wafer, photomask, slider, MEMS, semiconductor package, and micro-component process measurements.