The optical-electrical characteristic testing system for the OLED device comprises a computer, a single chip microcomputer, a multichannel ADC, a DAC1, a DAC2, an OLED driving and collecting circuit, a voltage reference source and a temperature sensor. By testing the current-voltage characteristics, luminous brightness-voltage characteristics, temperature-current characteristics, luminous efficiency-voltage characteristics, color coordinates and electroluminescence spectrum of OLED devices, the quality of the device's luminous performance and electrical performance can be judged.
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